The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 12, 2023

Filed:

Feb. 09, 2021
Applicant:

Fujifilm Corporation, Tokyo, JP;

Inventors:

Takatoshi Karino, Tokyo, JP;

Kazuyuki Itagaki, Tokyo, JP;

Makoto Ozeki, Tokyo, JP;

Shinji Hayashi, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/01 (2006.01); G06T 7/55 (2017.01); H04N 1/00 (2006.01); G06V 40/16 (2022.01);
U.S. Cl.
CPC ...
G06F 3/013 (2013.01); G06F 3/015 (2013.01); G06T 7/55 (2017.01); G06V 40/176 (2022.01); H04N 1/0023 (2013.01); G06F 2203/011 (2013.01);
Abstract

The information processing apparatus includes a space information acquisition unit that acquires space information based on the space sensing information, an object information acquisition unit that acquires object information, a user information acquisition unit that acquires user information based on the user sensing information, an attention level map creation unit that creates an attention level map showing an attention level of the user for each local area of the space, a goodness-of-fit map creation unit that creates a goodness-of-fit map showing a goodness-of-fit of the object for each local area, and a proposing unit that proposes a disposition of the object in the space on the basis of the attention level map and the goodness-of-fit map.


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