The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 12, 2023
Filed:
Mar. 20, 2023
Mloptic Corp, Redmond, WA (US);
Pengfei Wu, Bellevue, WA (US);
Wei Zhou, Sammamish, WA (US);
Wei Wang, Nanjing, CN;
Yongshui Cai, Nanjing, CN;
MLOptic Corp., Redmond, WA (US);
Abstract
A wavefront calibration method for a wavefront tester of a lens, the method including: measuring an air wavefront of the wavefront tester without the lens; measuring at least one golden sample wavefront to generate an actual wedge angle and refractive index of the at least one golden sample based on the air wavefront; calculating a measured wedge angle and refractive index based on the actual wedge angle and refractive index of the at least one golden sample; and linear fitting between the actual wedge angle and refractive index and the measured wedge angle and refractive index to produce an actual magnification of the lens.