The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 12, 2023

Filed:

Jun. 23, 2020
Applicant:

Fanuc Corporation, Yamanashi, JP;

Inventors:

Minoru Nakamura, Yamanashi, JP;

Yuuki Takahashi, Yamanashi, JP;

Atsushi Watanabe, Yamanashi, JP;

Assignee:

FANUC CORPORATION, Yamanashi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 17/894 (2020.01); G01B 11/14 (2006.01); G01S 17/42 (2006.01); G01S 17/88 (2006.01); G01S 7/51 (2006.01); G01S 7/4865 (2020.01);
U.S. Cl.
CPC ...
G01S 17/894 (2020.01); G01B 11/14 (2013.01); G01S 17/42 (2013.01); G01S 17/88 (2013.01); G01S 7/4865 (2013.01); G01S 7/51 (2013.01);
Abstract

A distance measurement device includes a light emission unit which is capable of emitting measurement light to be irradiated toward an object, a light reception unit configured to receive light from the object via an optical filter through which light having the same wavelength band as the measurement light passes, a distance calculation unit configured to calculate a distance to the object based on each charge amount obtained by accumulating a charge corresponding to the received light at a plurality of timings which are delayed by a predetermined phase with respect to emission timing of the measurement light, and an external light intensity calculation unit configured to calculate external light illuminance of external light illuminating the object at the spectral sensitivity of the optical filter based on the charge amounts acquired at the light reception unit and a reflectivity of the object.


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