The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 12, 2023

Filed:

Mar. 29, 2019
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Daisuke Ikefuji, Tokyo, JP;

Taichi Tanaka, Tokyo, JP;

Osamu Hoshuyama, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 13/90 (2006.01);
U.S. Cl.
CPC ...
G01S 13/9023 (2013.01); G01S 13/9004 (2019.05);
Abstract

The synthetic aperture radar image processing device includes time-series analysis unit which extracts persistent scatterers from time-series observation data for the observation direction for an observation area observed from multiple observation directions by a radar, and calculating displacement speeds of the extracted persistent scatterers, clustering unit which generates reflection point clusters by clustering extracted persistent scatterers based on their phase and position, distance calculation unit which calculates a distance between each of the persistent scatterers included in the reflection point clusters and each structure included in the observation area, representative value calculation unit which calculates each representative value for the distance between each persistent scatterer and each structure, for each reflection point cluster, and corresponding structure determination unit which associates the structure corresponding to the smallest representative value with the persistent scatterer, for each reflection point cluster.


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