The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 12, 2023

Filed:

Mar. 25, 2020
Applicant:

Topcon Corporation, Tokyo, JP;

Inventor:

Nobuyuki Nishita, Tokyo, JP;

Assignee:

Topcon Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 7/48 (2006.01); G01S 17/89 (2020.01); G01S 17/42 (2006.01);
U.S. Cl.
CPC ...
G01S 7/4808 (2013.01); G01S 17/42 (2013.01); G01S 17/89 (2013.01);
Abstract

Disclosed is a measurement device including: a distance measurement unit that has a light-generating element, a measurement light emission unit, a light reception unit, and a light reception element and measures a distance to a measurement target on the basis of a light reception signal; a deflection unit that is capable of performing scanning with measurement light; and a control unit that controls the distance measurement unit and the deflection unit. The control unit finds a surface of the measurement target, generates a grid having lines that are arranged at regular intervals on the surface of the measurement target and include a component parallel to a reference direction and a component perpendicular to the reference direction, and controls a deflection behavior of the deflection unit so that a scanning track of the measurement light traces the lines of the grid.


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