The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 12, 2023

Filed:

May. 07, 2018
Applicant:

Mitsubishi Electric Corporation, Tokyo, JP;

Inventors:

Tadashi Oshima, Tokyo, JP;

Yuichi Goda, Tokyo, JP;

Nobuhiro Suzuki, Tokyo, JP;

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01S 7/35 (2006.01); G01S 3/46 (2006.01); G01S 7/4914 (2020.01); G01S 7/497 (2006.01); G01S 13/933 (2020.01); G01S 13/931 (2020.01); G01S 13/95 (2006.01);
U.S. Cl.
CPC ...
G01S 7/354 (2013.01); G01S 3/46 (2013.01); G01S 7/497 (2013.01); G01S 7/4914 (2013.01); G01S 13/931 (2013.01); G01S 13/933 (2020.01); G01S 13/95 (2013.01);
Abstract

A subarray spatial averaging unit performs spatial averaging of correlation matrices by dividing a received signal of an array antenna to a plurality of subarrays having different shapes, and calculating these correlation matrices for the respective subarrays having different shapes. An eigenvalue expanding unit performs eigenvalue expansion of correlation matrices for the respective plurality of subarrays having different shapes after spatial averaging. A wave count estimating unit estimates an incoming wave count by integrating eigenvalues of the plurality of subarrays having different shapes obtained by the eigenvalue expanding unit.


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