The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 12, 2023

Filed:

Dec. 21, 2020
Applicant:

Shanxi University, Shanxi, CN;

Inventors:

Jianyong Hu, Shanxi, CN;

Ruiyun Chen, Shanxi, CN;

Chengbing Qin, Shanxi, CN;

Guofeng Zhang, Shanxi, CN;

Jie Ma, Shanxi, CN;

Liantuan Xiao, Shanxi, CN;

Suotang Jia, Shanxi, CN;

Assignee:

SHANXI UNIVERSITY, Shanxi, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 23/02 (2006.01); G01R 23/16 (2006.01);
U.S. Cl.
CPC ...
G01R 23/02 (2013.01); G01R 23/16 (2013.01);
Abstract

A frequency measurement method and a system thereof are provided. The method includes: generating to-be-detected emergent light under an action of the electro-optical crystal when a light source irradiates an electro-optical crystal disposed in the microwave electric field; detecting, by a single-photon detector, the to-be-detected emergent light to obtain a detection result of the single-photon detector; and determining a frequency of the microwave signal based on the detection result of the single-photon detector and a Fourier transform algorithm.


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