The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 12, 2023
Filed:
Feb. 24, 2021
Kabushiki Kaisha Toshiba, Tokyo, JP;
Hidefumi Takamine, Tokyo, JP;
Yuki Ueda, Kawasaki Kanagawa, JP;
Keisuke Ueno, Kawasaki Kanagawa, JP;
Takashi Usui, Saitama Saitama, JP;
Kazuo Watabe, Yokohama Kanagawa, JP;
Kabushiki Kaisha Toshiba, Tokyo, JP;
Abstract
According to one embodiment, a structure evaluation system includes a wave guide, a first sensor, a second sensor, and a calculation part. The wave guide is formed in a rod shape, is inserted into a hole that is formed at a predetermined depth from a surface of a measurement target, and has one end fixed to a deepest portion of the hole. The first sensor is provided at the other end of the wave guide at a position that is substantially the same as the surface. The second sensor is provided on the surface of the measurement target. The calculation part estimates a depth of damage occurring in the measurement target from the surface on the basis of a first detection value of an elastic wave transmitted to the measurement target which is detected by the first sensor through the wave guide and a second detection value obtained by an elastic wave which is detected by the second sensor.