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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 11754526 B1

PDFFull Text
Date of Patent:
Sep. 12, 2023

Filed:

Dec. 17, 2018

Method of evaluating analysis device, method of calibrating analysis device, analysis method, analysis device and non-transitory computer readable medium

Applicant:

Shimadzu Corporation, Kyoto, JP;

Inventor:

Yukihiko Kudo, Kyoto, JP;

Assignee:

SHIMADZU CORPORATION, Kyoto, JP;

Attorney:

Sughrue Mion, PLLC

Primary Examiner:

Michael Maskell

Int. Cl.
CPC ...
G01N 27/64 (2006.01); H01J 49/00 (2006.01); H01J 49/04 (2006.01); G01N 27/62 (2021.01);
U.S. Cl.
CPC ...
G01N 27/64 (2013.01); G01N 27/62 (2013.01); H01J 49/0009 (2013.01); H01J 49/0031 (2013.01); H01J 49/0422 (2013.01); H01J 49/0431 (2013.01);
Abstract

A method of evaluating an analysis device that is capable of detecting each of a plurality of compounds included in a sample includes introducing the sample including a first compound into the analysis device for measurement and detecting the first compound and at least one reaction product derived from the first compound, and acquiring information representing whether the analysis device is in a suitable state for an analysis based on an intensity of the detected first compound and an intensity of each of the detected at least one reaction product, and a relative response factor in regard to each of the first compound and the at least one reaction product.

Find Patent Forward Citations

Kudo, Yukihiko. (2023). Method of evaluating analysis device, method of calibrating analysis device, analysis method, analysis device and non-transitory computer readable medium (U.S. Patent No. 11754526). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11754526

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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