The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 12, 2023
Filed:
Apr. 30, 2018
Applicant:
Dow Global Technologies Llc, Midland, MI (US);
Inventors:
Sanjay C. Solanki, Midland, MI (US);
Donald L. McCarty, II, Midland, MI (US);
Robert A. Gunther, Midland, MI (US);
Jin Wang, Midland, MI (US);
Kyle A. Myers, Midland, MI (US);
Scott J. Collick, Midland, MI (US);
Assignee:
Dow Global Technologies LLC, Midland, MI (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 3/08 (2006.01); G01N 33/44 (2006.01); G01N 33/34 (2006.01); G01N 33/36 (2006.01);
U.S. Cl.
CPC ...
G01N 3/08 (2013.01); G01N 33/44 (2013.01); G01N 33/346 (2013.01); G01N 33/36 (2013.01); G01N 2203/0282 (2013.01);
Abstract
A method and a system for analyzing a physical characteristic of a film sample are described herein. The system includes a material holder system configured to hold the film sample; and a tear analysis device configured to tear the film sample and measure a characteristic of the tear. The movable system is configured to move the film sample in the material holder system to the tear analysis device.