The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 12, 2023

Filed:

Dec. 27, 2021
Applicant:

Industrial Technology Research Institute, Hsinchu, TW;

Inventors:

Yi-Jin Lin, Taichung, TW;

Shuo-Peng Liang, Taichung, TW;

Chien-Chih Liao, Taichung, TW;

Tzuo-Liang Luo, Taichung, TW;

Wan-Kun Chang, Taichung, TW;

Jen-Ji Wang, Changhua County, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/30 (2006.01); G01M 99/00 (2011.01);
U.S. Cl.
CPC ...
G01M 99/005 (2013.01);
Abstract

A process diagnosis system includes a digital twin calculation unit, a process diagnosis calculation unit, and a remote calculation analysis unit. The digital twin calculation unit obtains a vibration-related parameter and a cutting-related parameter of a processing device, and performs a simulation calculation for the vibration-related parameter, the cutting-related parameter and a three-dimensional model corresponding to the processing device to generate a three-dimensional calculation result. The process diagnosis calculation unit receives a three-dimensional calculation result and displays the three-dimensional calculation result. The remote calculation analysis unit receives the three-dimensional calculation result, and performs a simulation analysis for the three-dimensional calculation result to generate an analysis result.


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