The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 12, 2023

Filed:

Sep. 04, 2019
Applicant:

Nippon Telegraph and Telephone Corporation, Tokyo, JP;

Inventors:

Atsushi Nakamura, Musashino, JP;

Nazuki Honda, Musashino, JP;

Daisuke Iida, Musashino, JP;

Hiroyuki Oshida, Musashino, JP;

Keiji Okamoto, Musashino, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01M 11/00 (2006.01);
U.S. Cl.
CPC ...
G01M 11/3127 (2013.01); G01M 11/3145 (2013.01); G01M 11/3154 (2013.01);
Abstract

An object of the present invention is to provide an optical pulse test apparatus and an optical pulse test method that are capable of determining a change in state of an optical fiber connection portion without the need for reference and without being affected by changes in gap interval before and after the change in state. The optical pulse test apparatus according to the present invention is configured to perform an OTDR measurement by using test optical pulses having spectral widths of from several nm to several hundred nm arranged at intervals of several ten nm to several hundred nm, calculate a reflection peak value caused by the Fresnel reflection at the connection portion from the obtained OTDR waveform, and determine a state such as water immersion of the optical fiber connection portion based on the value.


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