The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 12, 2023
Filed:
Jul. 13, 2021
Applicant:
Fujifilm Corporation, Tokyo, JP;
Inventors:
Masahiro Hatta, Shizuoka, JP;
Hiroshi Kawakami, Shizuoka, JP;
Assignee:
FUJIFILM Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01L 1/24 (2006.01);
U.S. Cl.
CPC ...
G01L 1/247 (2013.01); G01L 1/242 (2013.01);
Abstract
Provided is a pressure measuring material having a substrate and a pressure-sensitive layer, wherein the pressure-sensitive layer contains a polymer matrix containing a polymer compound having a molecular weight of 1,000 or more, and microcapsules encapsulating an electron-donating dye precursor and a solvent, and an electron-accepting compound. Also provided is a method for manufacturing the pressure measuring material.