The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 12, 2023
Filed:
Jan. 21, 2020
Centre National DE LA Recherche Scientifique, Paris, FR;
Observatoire DE LA Cote D'azur, Nice, FR;
Universite Cote D'azur, Nice, FR;
Université Grenoble Alpes, Saint-Martin-d'Heres, FR;
François Henault, Grenoble, FR;
Alain Spang, Vence, FR;
CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE, Paris, FR;
OBSERVATOIRE DE LA COTE D'AZUR, Nice, FR;
UNIVERSITE COTE D'AZUR, Nice, FR;
UNIVERSITE GRENOBLE APLES, Saint-Martin-d'Heres, FR;
Abstract
Systems for inspecting a surface of an optical wave originating from an optical device are provided. The optical device includes an exit pupil, and the inspection system includes an optical measuring head and a computer for processing the images from said optical measuring head. The optical measuring head includes a density gradient filter, the density varying periodically in the two directions in space, a matrix frame having at least four identical lenses of square shape of the same focal length and being arranged symmetrically, and a photodetector array, each of the four lenses forming an image of the pupil in the plane of this array. The image processing computer includes computing means for computing the partial derivatives of the wave surface Δ(x, y) in the plane of the exit pupil.