The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 12, 2023
Filed:
Mar. 06, 2020
Gleason Metrology Systems Corporation, Dayton, OH (US);
Ethan James Shepherd, West Carrollton, OH (US);
Parag P. Wagaj, Springboro, OH (US);
GLEASON METROLOGY SYSTEMS CORPORATION, Dayton, OH (US);
Abstract
A probe calibration method and calibration artifact () whereby calibration can be performed without the use of machine axes capable of three dimensional positioning of a probe relative to a calibration sphere (). The method includes a plurality of calibration spheres fixed in relation to one another via a rigid structure comprising a calibration artifact body (). The spheres are mounted such that each will be sensed by the probe at some position of a machine axis (W, N). In other words, the spheres lie in the region swept out by the sensor field of view () over the movement of the machine axis. The calibration spheres are located at known positions (A, B, C) and the calibration artifact body is designed such that it may be mounted in a known location in place of a work piece.