The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 12, 2023

Filed:

Jul. 07, 2020
Applicant:

Eos Gmbh Electro Optical Systems, Krailling, DE;

Inventors:

Stefan Gruenberger, Munich, DE;

Stefanie Markl, Munich, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B29C 64/393 (2017.01); B33Y 30/00 (2015.01); G05B 19/402 (2006.01); B33Y 50/02 (2015.01); B22F 10/31 (2021.01); G01B 21/04 (2006.01); B22F 3/16 (2006.01);
U.S. Cl.
CPC ...
B29C 64/393 (2017.08); B22F 10/31 (2021.01); B33Y 30/00 (2014.12); B33Y 50/02 (2014.12); G01B 21/042 (2013.01); G05B 19/402 (2013.01); B22F 2003/166 (2013.01); G05B 2219/49023 (2013.01);
Abstract

A calibration method includes positioning the coating unit in a first measuring position and detecting a first position reference value with respect to the reference point and a first measuring point associated with the coating unit at the first measuring position, positioning the coating unit in a second measuring position by moving the coating unit in the direction of movement and detecting a second position reference value with respect to the reference point and a second measuring point associated with the coating unit at the second measuring position, and determining a correction value for the first application element and/or the second application element from the detected first position reference value and the detected second position reference value.


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