The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 12, 2023

Filed:

Apr. 16, 2021
Applicants:

General Electric Company, Schenectady, NY (US);

Concept Laser Gmbh, Lichtenfels, DE;

Inventors:

Fabian Zeulner, Lichtenfels, DE;

Christian Dicken, Bamberg, DE;

Justin Mamrak, Loveland, OH (US);

MacKenzie Ryan Redding, Mason, OH (US);

Bertram Gaerber, Neustadt bei Coburg, DE;

Assignees:

General Electric Company, Schenectady, NY (US);

Concept Laser GmbH, Lichtenfels, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B22F 10/85 (2021.01); B33Y 10/00 (2015.01); B33Y 30/00 (2015.01); B33Y 50/02 (2015.01); B22F 12/49 (2021.01); B22F 12/41 (2021.01); B22F 12/90 (2021.01); B22F 10/28 (2021.01); B22F 10/20 (2021.01); B08B 3/02 (2006.01);
U.S. Cl.
CPC ...
B22F 10/85 (2021.01); B22F 10/28 (2021.01); B22F 12/41 (2021.01); B22F 12/49 (2021.01); B22F 12/90 (2021.01); B33Y 10/00 (2014.12); B33Y 30/00 (2014.12); B33Y 50/02 (2014.12);
Abstract

An additive manufacturing machine may include an energy beam system configured to emit an energy beam utilized in an additive manufacturing process, and one or more optical elements utilized by, or defining a portion of, the energy beam system and/or an imaging system of the additive manufacturing machine. The imaging system may be configured to monitor one or more operating parameters of the additive manufacturing process. The additive manufacturing machine may include a light source configured to emit an assessment beam that follows an optical path incident upon the one or more optical elements, and one or more light sensors configured to detect a reflected beam comprising at least a portion of the assessment beam reflected and/or transmitted by at least one of the one or more optical elements. The additive manufacturing machine may include a control system configured to determine, based at least in part on assessment data comprising data from the one or more light sensors, whether the one or more optical elements exhibit an optical anomaly.


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