The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 12, 2023

Filed:

Mar. 24, 2020
Applicant:

Siemens Healthcare Gmbh, Erlangen, DE;

Inventors:

Elizaveta Stepina, Adelsdorf, DE;

Robert Brauweiler, Baiersdorf, DE;

Philip Mewes, Nuremberg, DE;

Assignee:

Siemens Healthcare GmbH, Erlangen, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01);
U.S. Cl.
CPC ...
A61B 6/467 (2013.01); A61B 6/54 (2013.01); A61B 6/542 (2013.01);
Abstract

The disclosure relates to devices, systems, and methods for controlling acquisition parameters when carrying out a medical x-ray examination, wherein the device includes a lever. The lever includes a deflectably supported lever arm, which is embodied to be deflected from a rest position to a first end point, in particular a kick-down stop point, and to a second end point, by a force, in particular the force of a foot and/or the force of a hand, wherein a first value of at least one acquisition parameter of the medical x-ray examination is determined by the deflection, wherein the first value is dependent on a measure of deflection of the deflection of the lever arm from the rest position to the first end point, wherein a second value of at least one acquisition parameter of the medical x-ray examination is able to be determined by a deflection of the lever arm to the second end point, and wherein the second value is independent of the measure of deflection of the deflection of the lever arm from the rest position.


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