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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 11751798 B1

PDFFull Text
Date of Patent:
Sep. 12, 2023

Filed:

Nov. 22, 2022

Method of evaluating concomitant clinical dementia rating and its future outcome using predicted age difference and program thereof

Applicant:

Acroviz Usa Inc., San Francisco, CA (US);

Inventors:

Wen-Yih Tseng, Taipei, TW;

Yung-Chin Hsu, New Taipei, TW;

Assignee:

ACROVIZ USA INC., San Francisco, CA (US);

Attorneys:

Locke Lord LLP

Tim Tingkang Xia, Esq.

Primary Examiner:

Molly Wilburn

Int. Cl.
CPC ...
A61B 5/00 (2006.01); G06T 7/00 (2017.01); A61B 5/055 (2006.01);
U.S. Cl.
CPC ...
A61B 5/4088 (2013.01); A61B 5/055 (2013.01); A61B 5/7275 (2013.01); G06T 7/0012 (2013.01); G06T 2207/10092 (2013.01); G06T 2207/30016 (2013.01);
Abstract

A method of quantitatively evaluating a cognitive status and its future change from a medical image of an individual's brain, the method comprising scanning the individual's brain with a scanning device so as to acquire at least one medical brain image; processing the medical brain image to obtain at least one feature of the image; using a pre-established prediction model to determine a condition of the cognitive status and predict its future change based on the at least one feature obtained.

Find Patent Forward Citations

Tseng, Wen-Yih. (2023). Method of evaluating concomitant clinical dementia rating and its future outcome using predicted age difference and program thereof (U.S. Patent No. 11751798). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11751798

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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