The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 05, 2023

Filed:

Mar. 16, 2022
Applicants:

Hideki Hashimoto, Tokyo, JP;

Daisuke Nikaku, Kanagawa, JP;

Yutaka Ohmiya, Tokyo, JP;

Inventors:

Hideki Hashimoto, Tokyo, JP;

Daisuke Nikaku, Kanagawa, JP;

Yutaka Ohmiya, Tokyo, JP;

Assignee:

RICOH COMPANY, LTD., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 1/00 (2006.01); H04N 1/12 (2006.01);
U.S. Cl.
CPC ...
H04N 1/00761 (2013.01); H04N 1/0057 (2013.01); H04N 1/00801 (2013.01); H04N 1/121 (2013.01); H04N 2201/0094 (2013.01);
Abstract

An image reading device includes a reading unit, a background member, and processing circuitry. The reading unit includes alight source to emit light to a passage area through which an object passes and an imaging device to capture reflected light of the light emitted to generate a visible image and an invisible image. The background member is disposed opposite the light source across the passage area. The processing circuitry is configured to: detect a change in an image characteristic due to a change in an optical characteristic of the reading unit, in invisible images obtained by capturing of invisible marks on the background member; determine a correction amount of an image characteristic to be used for correcting an image of the object generated by the imaging device, based on the change in the image characteristic detected; and correct the image characteristic based on the correction amount determined.


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