The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 05, 2023
Filed:
Sep. 27, 2018
Applicant:
Nec Corporation, Tokyo, JP;
Inventors:
Kazuhiko Minematsu, Tokyo, JP;
Norifumi Kamiya, Tokyo, JP;
Assignee:
NEC CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 9/32 (2006.01); G06F 7/58 (2006.01); G06F 7/78 (2006.01);
U.S. Cl.
CPC ...
H04L 9/3242 (2013.01); G06F 7/584 (2013.01); G06F 7/78 (2013.01);
Abstract
A MAC tag list generation apparatus, on reception of a nonce N unique value to each MAC generation process and a message M, generates a t×m group test matrix H serving as combinatorial group testing parameters for s (a positive integer) which is the number of the MACs to be generated, generates a MAC tag list T=(T[1], . . . , T[t]) by generating a MAC value T[i] corresponding to the i-th test (i=1, . . . , t) using the group test matrix H, the nonce N, and pseudorandom functions F and G with variable length input and fixed length output for the message M, and outputs the MAC tag list.