The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 05, 2023
Filed:
Sep. 25, 2018
Keysight Technologies, Inc., Santa Rosa, CA (US);
Gregory Douglas Vanwiggeren, San Jose, CA (US);
KEYSIGHT TECHNOLOGIES, INC., Santa Rosa, CA (US);
Abstract
A system is provided for characterizing a device under test (DUT) including an integrated antenna array. The system includes an optical subsystem having first and second focal planes, where the integrated antenna array is positioned in a beam overlap region extending from the first focal plane of the optical subsystem. The system further includes a measurement array having multiple array elements positioned substantially on the second focal plane of the optical subsystem, the measurement array being configured to receive signals from the DUT, and/or to transmit substantially collimated beams to the DUT, via the optical subsystem. Far-field characteristics of the DUT are measured, as well as angular dependence of each of the far-field characteristics.