The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 05, 2023

Filed:

May. 08, 2020
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Satoshi Yoshida, Tokyo, JP;

Jianquan Liu, Tokyo, JP;

Shoji Nishimura, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 40/10 (2022.01); G06V 40/16 (2022.01); G06V 10/771 (2022.01); G06V 10/77 (2022.01); G06V 10/74 (2022.01);
U.S. Cl.
CPC ...
G06V 40/171 (2022.01); G06V 10/761 (2022.01); G06V 10/771 (2022.01); G06V 10/7715 (2022.01);
Abstract

A retrieval apparatus () is accessible to a storage region () in which a plurality of pieces of object information () are stored. The object information () includes a feature value set () being a set of a plurality of feature values acquired regarding an object. The retrieval apparatus () acquires a feature value set (retrieval target set ()) being a retrieval target, and determines the object information () having the feature value set () similar to the retrieval target set () by comparing the retrieval target set () with the feature value set (). Herein, in a case where a feature value set satisfies a predetermined condition, the retrieval apparatus () performs comparison between the feature value set and another feature value set by using a part of feature values within the feature value set. Further, the retrieval apparatus () outputs output information relating to the determined object information ().


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