The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 05, 2023
Filed:
Oct. 12, 2020
Shenzhen University, Guangdong, CN;
Hui Huang, Shenzhen, CN;
Jiahui Lyu, Shenzhen, CN;
Shenzhen University, Guangdong, CN;
Abstract
Disclosed are a mesh reconstruction method and apparatus for a transparent object, a computer device and a storage medium. The method includes: acquiring object images of the transparent object at multiple capture view angles and calibration information corresponding to an image capture device, the image capture device configured to capture being the object images; generating an initial mesh model corresponding to the transparent object according to the object images acquired at the multiple capture view angles; determining a light ray refraction loss corresponding to an emergent light ray of the image capture device according to the calibration information, and determining a model loss corresponding to the initial mesh model according to the light ray refraction loss; and reconstructing the initial mesh model according to the model loss, to obtain a target mesh model corresponding to the transparent object.