The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 05, 2023

Filed:

Jun. 23, 2022
Applicant:

Agilent Technologies, Inc., Santa Clara, CA (US);

Inventors:

Elad Arbel, Santa Clara, CA (US);

Itay Remer, Santa Clara, CA (US);

Amir Ben-Dor, Santa Clara, CA (US);

Assignee:

Agilent Technologies, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06T 7/10 (2017.01); G06T 7/187 (2017.01); G06T 7/11 (2017.01); G06T 7/174 (2017.01); G06N 20/00 (2019.01); G06F 3/0482 (2013.01); G06F 3/0486 (2013.01); G06N 3/08 (2023.01); G06F 18/2431 (2023.01); G06V 10/764 (2022.01); G06V 10/774 (2022.01); G06V 10/80 (2022.01); G06V 10/82 (2022.01); G06V 10/26 (2022.01); G06V 10/28 (2022.01); G06V 20/69 (2022.01); G06V 10/94 (2022.01); G06V 10/24 (2022.01);
U.S. Cl.
CPC ...
G06T 7/0012 (2013.01); G06F 3/0482 (2013.01); G06F 3/0486 (2013.01); G06F 18/2431 (2023.01); G06N 3/08 (2013.01); G06N 20/00 (2019.01); G06T 7/0014 (2013.01); G06T 7/10 (2017.01); G06T 7/11 (2017.01); G06T 7/174 (2017.01); G06T 7/187 (2017.01); G06V 10/267 (2022.01); G06V 10/28 (2022.01); G06V 10/764 (2022.01); G06V 10/7753 (2022.01); G06V 10/809 (2022.01); G06V 10/82 (2022.01); G06V 10/945 (2022.01); G06V 20/695 (2022.01); G06V 20/698 (2022.01); G06T 2207/10056 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/20104 (2013.01); G06T 2207/30024 (2013.01); G06T 2207/30096 (2013.01); G06V 10/247 (2022.01);
Abstract

Novel tools and techniques are provided for implementing digital microscopy imaging using deep learning-based segmentation and/or implementing instance segmentation based on partial annotations. In various embodiments, a computing system might receive first and second images, the first image comprising a field of view of a biological sample, while the second image comprises labeling of objects of interest in the biological sample. The computing system might encode, using an encoder, the second image to generate third and fourth encoded images (different from each other) that comprise proximity scores or maps. The computing system might train an AI system to predict objects of interest based at least in part on the third and fourth encoded images. The computing system might generate (using regression) and decode (using a decoder) two or more images based on a new image of a biological sample to predict labeling of objects in the new image.


Find Patent Forward Citations

Arbel, Elad. (2023). Deep learning based instance segmentation via multiple regression layers (U.S. Patent No. 11748881). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11748881

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…