The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 05, 2023

Filed:

Jan. 03, 2022
Applicant:

Enscape Co., Ltd., Seongnam, KR;

Inventors:

Nam Dong Kim, Suwon, KR;

Sang Sik Min, Hwaseong, KR;

Won Young Jeong, Suwon, KR;

Yong Deong Kang, Seongnam, KR;

Assignee:

ENSCAPE CO., LTD., Seongnam, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); B25J 9/16 (2006.01); H04N 23/74 (2023.01);
U.S. Cl.
CPC ...
G06T 7/0004 (2013.01); B25J 9/1697 (2013.01); H04N 23/74 (2023.01); G06T 2207/10152 (2013.01); G06T 2207/20021 (2013.01); G06T 2207/20212 (2013.01);
Abstract

Disclosed are an apparatus and method for inspecting appearance of secondary batteries, in which a plurality of secondary batteries arranged in a lateral direction are rotated at a time, a photographed image obtained by a camera according to rotated angles is divided into individual image sections where the secondary batteries are respectively photographed, and an inspection image is generated by combining the individual image sections according to the photographed images of one secondary battery.


Find Patent Forward Citations

Kim, Nam. (2023). Apparatus and method for secondary battery appearance inspection (U.S. Patent No. 11748867). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11748867

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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