The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 05, 2023
Filed:
Mar. 29, 2021
Quanta Computer Inc., Taoyuan, TW;
QUANTA COMPUTER INC., Taoyuan, TW;
Abstract
A method for detecting defects in a near-eye display is provided. The method includes the following steps: obtaining a reference image and a DUT image according to a first image and a second image captured by a camera through a Fresnel lens when a display panel respectively displays a test-pattern image and a test-background image; performing a fast Fourier transform on the reference image and the DUT image to obtain a frequency-domain reference image and a frequency-domain DUT image; calculating an average value of pixel values above a predetermined cut-off ratio in a histogram of each first region of interest (ROI) in a filtered frequency-domain reference image as a corresponding threshold; comparing each pixel in the filtered DUT image with the corresponding threshold to generate a determination result; and building a defective-status map of the near-eye display according to the determination results.