The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 05, 2023

Filed:

Feb. 18, 2021
Applicant:

Cognex Corporation, Natick, MA (US);

Inventors:

Ben R. Carey, Cambridge, MA (US);

Andrew Parrett, Boston, MA (US);

Yukang Liu, Natick, MA (US);

Gilbert Chiang, West Linn, OR (US);

Assignee:

Cognex Corporation, Natick, MA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06V 20/64 (2022.01); G06T 1/00 (2006.01); G06T 7/292 (2017.01); G06T 7/80 (2017.01); G06T 7/246 (2017.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G06T 1/0014 (2013.01); G06T 7/0004 (2013.01); G06T 7/251 (2017.01); G06T 7/292 (2017.01); G06T 7/85 (2017.01); G06V 20/64 (2022.01); G06V 2201/12 (2022.01);
Abstract

This invention provides a system and method for using an area scan sensor of a vision system, in conjunction with an encoder or other knowledge of motion, to capture an accurate measurement of an object larger than a single field of view (FOV) of the sensor. It identifies features/edges of the object, which are tracked from image to image, thereby providing a lightweight way to process the overall extents of the object for dimensioning purposes. Logic automatically determines if the object is longer than the FOV, and thereby causes a sequence of image acquisition snapshots to occur while the moving/conveyed object remains within the FOV until the object is no longer present in the FOV. At that point, acquisition ceases and the individual images are combined as segments in an overall image. These images can be processed to derive overall dimensions of the object based on input application details.


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