The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 05, 2023

Filed:

Aug. 07, 2020
Applicant:

Amazon Technologies, Inc., Seattle, WA (US);

Inventors:

Umut Orhan, Seattle, WA (US);

Harshad Vasant Kulkarni, Bellevue, WA (US);

Jasmeet Chhabra, Sammamish, WA (US);

Vikas Dharia, Sammamish, WA (US);

Assignee:

Amazon Technologies, Inc., Seattle, WA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 40/289 (2020.01); G06F 40/284 (2020.01); H04L 41/16 (2022.01); H04L 43/16 (2022.01); H04L 43/024 (2022.01);
U.S. Cl.
CPC ...
G06F 40/284 (2020.01); H04L 41/16 (2013.01); H04L 43/16 (2013.01); H04L 43/024 (2013.01);
Abstract

A plurality of metrics records, including some records indicating metrics for which anomaly analysis has been performed, is obtained. Using a training data set which includes the metrics records, a machine learning model is trained to predict an anomaly analysis relevance score for an input record which indicates a metric name. Collection of a particular metric of an application is initiated based at least in part on an anomaly analysis relevance score obtained for the particular metric using a trained version of the model.


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