The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 05, 2023
Filed:
Jan. 04, 2021
Mettler-toledo (Changzhou) Precision Instruments Ltd., Jiangsu, CN;
Mettler-toledo (Changzhou) Measurement Technology Ltd., Jiangsu, CN;
Mettler-toledo International Trading (Shanghai) Co., Ltd., (Shanghai) Pilot Free Trade Zone, CN;
Jean-Christophe Emery, Jiangsu, CN;
Michael Heidingsfelder, Kiawah Island, SC (US);
Eugen Schibli, Schaffhausen, CH;
Feng Dai, Jiangsu, CN;
Qing Chen, Jiangsu, CN;
GuoJun Xie, Jiangsu, CN;
METTLER-TOLEDO (CHANGZHOU) PRECISION INSTRUMENTS LTD., Jiangsu, CN;
METTLER-TOLEDO (CHANGZHOU) MEASUREMENT TECHNOLOGY LTD., Jiangsu, CN;
METTLER-TOLEDO INTERNATIONAL TRADING (SHANGHAI) CO., LTD., Pilot Free Trade Zone, CN;
Abstract
A method and apparatus are disclosed for managing a measurement device based on a blockchain, which is applied to node devices in a blockchain network. The method can include obtaining device state data of the measurement device at various stages in the life cycle of the measurement device; constructing a target transaction based on the obtained device state data, and then sending the target transaction to other node devices in the blockchain network to perform consensus processing on the target transaction; and storing, when a consensus of the target transaction is reached, the target transaction into a distributed ledger of the blockchain network, wherein the target transaction stored in the distributed ledger of the blockchain network is used for life cycle management of the measurement device.