The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 05, 2023

Filed:

May. 20, 2021
Applicant:

Vmware, Inc., Palo Alto, CA (US);

Inventors:

Keshav Mathur, Mountain View, CA (US);

Jinyi Lu, Mountain View, CA (US);

Paul Pedersen, Palo Alto, CA (US);

Junyuan Lin, Seattle, CA (US);

Darren Brown, Seattle, WA (US);

Peng Gao, Palo Alto, CA (US);

Leah Nutman, Sunnyvale, CA (US);

Xing Wang, Palo Alto, CA (US);

Assignee:

VMWARE, INC., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/50 (2006.01); G06F 11/34 (2006.01); G06N 5/048 (2023.01); G06F 11/30 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3442 (2013.01); G06F 9/5027 (2013.01); G06F 11/3006 (2013.01); G06F 11/3447 (2013.01); G06N 5/048 (2013.01);
Abstract

Various examples are disclosed for transitioning usage forecasting in a computing environment. Usage of computing resources of a computing environment are forecasted using a first forecasting data model and usage measurements obtained from the computing resources. A use of the first forecasting data model in forecasting the usage is transitioned to a second forecasting data model without incurring downtime in the computing environment. After the transition, the usage of the computing resources of the computing environment is forecasted using the second forecasting data model and the usage measurements obtained from the computing resources. The second forecasting data model exponentially decays the usage measurements based on a respective time period at which the usage measurements were obtained.


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