The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 05, 2023
Filed:
Oct. 18, 2021
Stephan Maier, Askim, SE;
Stephan Maier, Askim, SE;
Stefan Kuczera, Pixbo, SE;
Other;
Abstract
An approach to estimate noise, Rician signal bias and true signal in magnitude signal data obtained with magnetic resonance imaging. The method uses multiple measurements at different scan parameter settings, also referred to as weightings, and an iterative algorithm to estimate noise, expected signal and associated Rician signal bias. Measurements at all measured weighting levels contribute to the ultimate estimation of the bias-free signal decay function. Therefore, of the so processed magnetic resonance image data, weighted signals can be computed at arbitrary weighting levels and with considerably better signal-to-noise ratio than the originally obtained data at corresponding weightings. Bias-free weighted image data at desired weighting levels, maps of the decay function fit parameters, or maps of a combination of such decay function parameters can be used for rapid and highly sensitive tissue characterization.