The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 05, 2023

Filed:

Jul. 30, 2020
Applicant:

Openlight Photonics, Inc., Goleta, CA (US);

Inventors:

Steven William Keck, Mountain View, CA (US);

Crispin Cruz Mapagay, El Dorado Hills, CA (US);

Mark Stenholm, Fremont, CA (US);

Assignee:

OpenLight Photonics, Inc., Goleta, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/317 (2006.01); G02B 6/42 (2006.01); G01N 21/31 (2006.01);
U.S. Cl.
CPC ...
G01R 31/3171 (2013.01); G01N 21/31 (2013.01); G02B 6/4226 (2013.01); G01N 2201/06113 (2013.01); G01N 2201/08 (2013.01);
Abstract

A hybrid optical-electrical automated testing equipment (ATE) system can implement a workpress assembly that can interface with a device under test (DUT) and a load board that holds the DUT during testing, analysis, and calibration. A test hand can actuate to position the DUT on a socket and align one or more alignment features. The workpress assembly can include two optical interfaces that are optically coupled such that light can be provided to a side of the DUT that is facing away from the load board, thereby enabling the ATE system to perform simultaneous optical and electrical testing of the DUT.


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