The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 05, 2023

Filed:

Oct. 18, 2021
Applicant:

Dell Products L.p., Round Rock, TX (US);

Inventors:

Bhyrav Mutnury, Austin, TX (US);

Umesh Chandra, Santa Cruz, CA (US);

Assignee:

Dell Products L.P., Round Rock, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/22 (2006.01); G06F 11/30 (2006.01); G08B 21/18 (2006.01);
U.S. Cl.
CPC ...
G01N 27/223 (2013.01); G01N 27/221 (2013.01); G06F 11/3024 (2013.01); G06F 11/3058 (2013.01); G08B 21/182 (2013.01);
Abstract

In one or more embodiments, one or more systems, one or more methods, and/or one or more processes may measure at least one of a first height value and a first width value of a first eye diagram of a first signal; measure at least one of a second height value and a second width value of a second eye diagram of a second signal; determine at least one of a height difference value and a width difference value respectively between the at least one of the first height value and the first width value of the first eye diagram and the at least one of the second height value and the second width value of the second eye diagram; and determine that the at least one of the height difference value and the width difference value respectively meets or exceeds a height threshold value or a width threshold value.


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