The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 05, 2023
Filed:
Sep. 20, 2021
Applicant:
Salvus, Llc, Valdosta, GA (US);
Inventors:
Ron Levin, Valdosta, GA (US);
Clinton Beeland, Valdosta, GA (US);
James LeFiles, Valdosta, GA (US);
Joseph Egan, Atlanta, GA (US);
Timothy Zollers, Atlanta, GA (US);
Jacob Thompson, Atlanta, GA (US);
Assignee:
SALVUS, LLC, Valdosta, GA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/45 (2006.01); G01N 21/45 (2006.01); G01N 33/53 (2006.01); G01N 21/77 (2006.01);
U.S. Cl.
CPC ...
G01N 21/45 (2013.01); G01J 3/45 (2013.01); G01N 21/77 (2013.01); G01N 33/5308 (2013.01); G01N 2021/7779 (2013.01);
Abstract
A point of use analyte detection and quantification system for agricultural applications is provided. Related methods are also provided.
Levin, Ron. (2023). Interferometric detection and quantification system and methods of use in agriculture (U.S. Patent No. 11747276). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11747276
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile