The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 05, 2023
Filed:
Dec. 09, 2021
Samsung Display Co., Ltd., Yongin-si, KR;
Korea Advanced Institute of Science and Technology, Daejeon, KR;
Minsang Koo, Seongnam-si, KR;
Do Kyung Kim, Daejeon, KR;
Sanghoon Kim, Hwaseong-si, KR;
Seungho Kim, Asan-si, KR;
Seongjin Hwang, Suwon-si, KR;
Jung Hoon Kong, Daejeon, KR;
Dong Gyu Kim, Daejeon, KR;
SAMSUNG DISPLAY CO., LTD., Yongin-si, KR;
KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY, Daejeon, KR;
Abstract
An impact test apparatus includes a base plate having an upper surface on which a specimen is placed, a collision member that collides with the specimen, a dropping unit that drops the collision member from an upper area of the specimen to the specimen and adjusts a height that the collision member drops, a velocity measurement unit that measures a collision velocity of the collision member when the collision member collides with the specimen, and an evaluation unit that produces a representative value that is a collision velocity at which a probability of breakage of the specimen is about 50%, and evaluates an impact resistance of the specimen based on the representative value.