The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 05, 2023
Filed:
Apr. 03, 2020
Ecole Polytechnique Federale DE Lausanne (Epfl), Lausanne, CH;
Mohammad Hussein Kahrobaiyan, Neuchatel, CH;
Charles Baur, St-Aubin, CH;
Simon Henein, Neuchatel, CH;
Mohamed Zanaty, Neuchatel, CH;
ECOLE POLYTECHNIQUE FEDERALE DE LAUSANNE (EPFL), Lausanne, CH;
Abstract
Device and method for measuring contact force exerted by an object on a probe comprising a lever and said probe for contacting the object is provided. The lever is pivotably coupled to a body by a coupling module. The device comprising a fixed frame coupled to the body. The body is designed to be moved with respect to the object to put the probe in contact with the object to create force pivoting said lever with respect to the body around a pivot axis. The device comprising a sensor for measuring displacement of the lever with respect to the body upon pivoting. The coupling module comprises control stiffness module, so that when the probe contacts the object, the displacement of the lever is proportional to the force exerted by the probe on the object. Such control stiffness module is tunable so that accuracy and sensitivity of measured force is controlled.