The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 05, 2023
Filed:
Dec. 28, 2021
Applicant:
Ciena Corporation, Hanover, MD (US);
Inventors:
Yinqing Pei, Kanata, CA;
Jean-Luc Archambault, Ottawa, CA;
David W. Boertjes, Nepean, CA;
David R. Doucet, Almonte, CA;
Assignee:
Ciena Corporation, Hanover, MD (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04B 10/077 (2013.01); G01J 4/00 (2006.01); G02B 6/42 (2006.01); H01S 3/00 (2006.01);
U.S. Cl.
CPC ...
G01J 4/00 (2013.01); G02B 6/4216 (2013.01); H01S 3/0007 (2013.01); H04B 10/0775 (2013.01); H04B 2210/078 (2013.01);
Abstract
A management system for an optical line system includes one or more processors and memory storing instructions that, when executed, cause the one or more processors to receive State of Polarization (SOP) measurements from one or more optical components in the optical line system, wherein the SOP measurements are taken while traffic-bearing channels are operating, and monitor health of one or more fibers based on the SOP measurements. The health can include detection and/or localization of SOP transients.