The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 05, 2023
Filed:
Dec. 07, 2017
Applicant:
Henkel Ag & Co. Kgaa, Duesseldorf, DE;
Inventors:
Arnd Kessler, Monheim am Rhein, DE;
Christian Nitsch, Duesseldorf, DE;
Lars Zuechner, Langenfeld, DE;
Georg Wawer, Vienna, AT;
Alexander Mueller, Monheim, DE;
Clemens Arth, Graz, AT;
Assignee:
HENKEL AG & CO. KGAA, Duesseldorf, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
D06F 39/00 (2020.01); D06F 33/37 (2020.01); G06T 7/521 (2017.01); G06T 7/593 (2017.01); D06F 58/30 (2020.01); D06F 39/02 (2006.01); D06F 34/18 (2020.01); D06F 103/02 (2020.01); D06F 105/42 (2020.01);
U.S. Cl.
CPC ...
D06F 33/37 (2020.02); D06F 39/02 (2013.01); D06F 58/30 (2020.02); G06T 7/521 (2017.01); G06T 7/593 (2017.01); D06F 34/18 (2020.02); D06F 2103/02 (2020.02); D06F 2105/42 (2020.02);
Abstract
A method performed by one or more devices is disclosed. The method includes obtaining a geometry information item representative of a spatial location of a plurality of points of a surface of a textile (), determining at least one treatment parameter for treating the textile () at least partially based on a geometry information item, and outputting or triggering an output of the at least one treatment parameter.