The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 05, 2023

Filed:

Jun. 04, 2021
Applicants:

Deere & Company, Moline, IL (US);

Iowa State University Research Foundation, Inc., Ames, IA (US);

Inventors:

Brandon C. Carlson, Ankeny, IA (US);

Jeffrey S. Wigdahl, Ames, IA (US);

Nicholas W. Vanlaningham, Bondurant, IA (US);

Kurt D. Gustafson, Altoona, IA (US);

Jeffrey C. Askey, Boone, IA (US);

Assignees:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A01D 46/08 (2006.01); A01D 41/127 (2006.01); A01F 15/07 (2006.01);
U.S. Cl.
CPC ...
A01D 46/085 (2013.01); A01D 41/1271 (2013.01); A01D 41/1272 (2013.01); A01F 15/07 (2013.01);
Abstract

A cotton harvester estimates the mass of cotton as it is harvested using sensor devices and compares the mass of each module against the estimated mass of the module as determined by the sensors so that a calibration factor may be determined and actively updated for more accurate crop yield determination. The mass flow for a specific module is accumulated and processed during harvesting using a base calibration factor and the module is weighed and compared against the expected mass using the base calibration factor to develop a candidate updated calibration factor. The base calibration factor is selectively replaced by the candidate updated calibration factor for processing a subsequent module based on machine feedback information relating to the operation of the harvester. Harvested crop data determined using the calibration factor is used to generate highly accurate yield maps.


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