The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 29, 2023

Filed:

Apr. 25, 2023
Applicant:

Citibank, N.a., New York, NY (US);

Inventors:

Sunny Behl, Irving, TX (US);

Hariharan Badrinathan, Tamilnadu, IN;

Assignee:

CITIBANK, N.A., New York, NY (US);

Attorney:
Int. Cl.
CPC ...
H04L 9/40 (2022.01); H04L 41/16 (2022.01);
U.S. Cl.
CPC ...
H04L 63/1425 (2013.01); H04L 41/16 (2013.01);
Abstract

Presented herein are system and methods for detecting anomalies in microservices. A server may receive a first plurality of metrics from a microservice of a plurality of microservices. Each of the microservices may provide a respective function for an application independently from other microservices. The server may apply the first plurality of metrics to an ensemble of anomaly detection models to generate classifications. Each of the classifications may indicate the first plurality of metrics as one of anomalous or normal from a respective model of the ensemble. The ensemble may be trained using a second plurality of metrics from the microservice. The server may identify a majority of the plurality of classifications as indicating the first plurality of metrics as anomalous. The server may determine that at least one of the first plurality of metrics satisfies a threshold. The server may generate an alert to indicate an anomaly event.


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