The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 29, 2023

Filed:

Sep. 14, 2021
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Ke Wei Wei, Beijing, CN;

Wei Liu, Beijing, CN;

Guo Ran Sun, Beijing, CN;

Shuang YS Yu, Beijing, CN;

Meichi Maggie Lin, San Jose, CA (US);

Yi Dai, Beijing, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 41/16 (2022.01); H04L 41/12 (2022.01); G06F 16/35 (2019.01); G06N 20/00 (2019.01); G06F 16/33 (2019.01); G06F 18/22 (2023.01);
U.S. Cl.
CPC ...
H04L 41/16 (2013.01); G06F 16/3347 (2019.01); G06F 16/35 (2019.01); G06F 18/22 (2023.01); G06N 20/00 (2019.01); H04L 41/12 (2013.01);
Abstract

A method includes generating a plurality of vectors representing words in a plurality of documents about an information technology (IT) system and clustering the plurality of vectors to produce a plurality of clusters. The method also includes identifying a cluster of the plurality of clusters that contains a plurality of clustered vectors, generating a feature based on a plurality of words represented by the plurality of clustered vectors, and training a machine learning model to identify an anomaly in the IT system based on the feature.


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