The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 29, 2023
Filed:
Oct. 06, 2021
Kymeta Corporation, Redmond, WA (US);
Taylor Stokes, Monroe, WA (US);
JT Repp, Monroe, WA (US);
Ron Radko, Kirkland, WA (US);
Jonas Nicholson, Preston, WA (US);
Alexander L. Bautista, Jr., Renton, WA (US);
Kymeta Corporation, Redmond, WA (US);
Abstract
A method and apparatus for testing an antenna are described. In on embodiment, the antenna comprises: a memory; an antenna aperture with a plurality of electronically controlled radio frequency (RF) radiating antenna elements; a pattern generator, including one or more processors, to generate a plurality of patterns to apply to the antenna aperture during testing to cause the antenna to generate a beam in response to each pattern of the plurality of patterns while pointing at a satellite; a receiver to receive satellite signals from the satellite in response to generating beams with the aperture; a metric provider, including one or more processors, to generate one or more satellite signal metrics for the received satellite signals; and antenna parameter selector to select one or more parameters associated with beamforming based on the satellite signal metrics indicating antenna performance reached a predetermined level, wherein selection of the one or more parameters is for storage in the memory and used to generate a beam with the antenna aperture when performing data communication.