The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 29, 2023

Filed:

Jan. 11, 2019
Applicant:

Hitachi High-tech Corporation, Tokyo, JP;

Inventors:

Takashi Dobashi, Tokyo, JP;

Hirokazu Tamaki, Tokyo, JP;

Hiromi Mise, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/20 (2006.01); G06T 7/73 (2017.01); G01N 23/04 (2018.01); G01N 23/06 (2018.01); H01J 37/22 (2006.01); H01J 37/26 (2006.01);
U.S. Cl.
CPC ...
H01J 37/20 (2013.01); G01N 23/04 (2013.01); G01N 23/06 (2013.01); G06T 7/74 (2017.01); H01J 37/222 (2013.01); H01J 37/26 (2013.01); G01N 2223/04 (2013.01); G01N 2223/10 (2013.01); G01N 2223/3306 (2013.01); G01N 2223/418 (2013.01); G06T 2207/10061 (2013.01); H01J 2237/20207 (2013.01);
Abstract

A charged particle beam device includes: a movement mechanism configured to hold and move a sample; a charged particle source configured to emit charged particles with which the sample is irradiated to obtain an image of the sample; and a control unit configured to control the movement mechanism to move the sample and to obtain the image of the sample. The control unit obtains a reference image of the sample in a reference arrangement state by the charged particles, generates a goal image of the sample in a target arrangement state different from the reference arrangement state by calculation from the reference image, moves the sample to each of different arrangement states by the movement mechanism, obtains a candidate image of the sample in each of the different arrangement states by the charged particles, and generates a comparison result between respective candidate images and the goal image.


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