The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 29, 2023

Filed:

Oct. 21, 2021
Applicant:

Advanced Micro Devices, Inc., Santa Clara, CA (US);

Inventors:

YuBin Yao, Shanghai, CN;

Eric M. Scott, San Fransisco, CA (US);

TieFeng Liu, Shanghai, CN;

Assignee:

Advanced Micro Devices, Inc., Santa Clara, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01); G11C 29/02 (2006.01); G06F 3/06 (2006.01); G11C 7/10 (2006.01); G11C 7/22 (2006.01);
U.S. Cl.
CPC ...
G11C 29/028 (2013.01); G06F 3/0673 (2013.01); G11C 7/1066 (2013.01); G11C 7/222 (2013.01); G11C 29/023 (2013.01);
Abstract

A method for performing read training of a memory channel includes writing a data pattern to a memory using a data bus having a predetermined number of bit lanes. An edge of a read data eye is determined individually for each bit lane by reading the data pattern over the data bus using a read bust cycle having a predetermined length, grouping data received on each bit lane over the read burst cycle to form a bit lane data group, and comparing the bit lane data group to corresponding expected data of the data pattern for each bit lane, logging a phase of each bit lane on which said edge is found, and repeating the reading, grouping, comparing, and logging until the edge is found for all of the bit lanes.


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