The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 29, 2023

Filed:

Mar. 03, 2020
Applicant:

Wrethink, Inc., Del Mar, CA (US);

Inventors:

James Gardner, Palm Springs, CA (US);

Arlene Harris, Del Mar, CA (US);

Assignee:

Wrethink, Inc., Del Mar, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/46 (2006.01); G06V 20/10 (2022.01); G06V 10/40 (2022.01); G06F 18/21 (2023.01); G06F 18/213 (2023.01); G06V 20/70 (2022.01);
U.S. Cl.
CPC ...
G06V 20/10 (2022.01); G06F 18/213 (2023.01); G06F 18/2193 (2023.01); G06V 10/40 (2022.01); G06V 20/70 (2022.01); G06V 2201/10 (2022.01);
Abstract

Methods and apparatus for using one or more feature recognition system(s) to identify features in a scanned image and to associate tags with identified features are described. Probabilities of a feature being present are taken into consideration in some embodiments. In various embodiments once a tag has been determined as corresponding to a feature which has been confirmed as being in the scanned image synonyms for the tag word are identified and also associated with the scanned image. By using results of multiple automated feature recognition systems and generating overall probabilities that a feature is present in an image more reliable tagging can be implemented in an automated manner than in system which rely on a single AI system without the need for extensive operator input with respect to identification of all features in the image which are to be tagged.


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