The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 29, 2023
Filed:
Jul. 13, 2020
University of Surrey, Guildford, GB;
Lucia Florescu, Guildford, GB;
Vadim Markel, Philadelphia, PA (US);
John C Schotland, Ann Arbor, MI (US);
University of Surrey, Guildford, GB;
Abstract
Apparatus and methods for constructing a tomographic image of a sample are disclosed. The apparatus comprises at least one source configured to emit electromagnetic radiation at a first wavelength, at least one angularly-selective detector configured to detect the electromagnetic radiation at a second wavelength after the electromagnetic radiation has interacted with the sample, and a controller configured to construct a tomographic image of the sample based on information gathered using the at least one detector. The controller obtains information indicative of an intensity of the electromagnetic radiation detected at a second position by the at least one detector while the source is in a first position. Then, the source and detector positions are interchanged, and the controller obtains information indicative of an intensity of the electromagnetic radiation detected at the first position by the at least one detector while the electromagnetic radiation is emitted from the second position. By utilising the non-reciprocity of the broken ray transform, the controller can determine a first coefficient relating to an attenuation of the electromagnetic radiation in the sample at the first wavelength, a second coefficient relating to an attenuation of the electromagnetic radiation in the sample at the second wavelength, and a third coefficient relating to a material property that influences the intensity of the electromagnetic radiation measured by the at least one detector, and construct a tomographic image of the sample based on the determined first, second and third coefficients.