The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 29, 2023
Filed:
Jun. 04, 2021
Applicant:
Fujifilm Business Innovation Corp., Tokyo, JP;
Inventors:
Rina Takeuchi, Kanagawa, JP;
Daigo Hama, Kanagawa, JP;
Assignee:
FUJIFILM Business Innovation Corp., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 15/00 (2006.01); G06T 7/00 (2017.01); G06T 7/32 (2017.01); G06T 7/13 (2017.01);
U.S. Cl.
CPC ...
G06T 7/001 (2013.01); G06K 15/408 (2013.01); G06T 7/13 (2017.01); G06T 7/32 (2017.01); G06T 2207/10008 (2013.01); G06T 2207/20021 (2013.01); G06T 2207/30144 (2013.01);
Abstract
An inspection device includes a processor configured to acquire image information of each of a correct image and a target image as an inspection target, divide each of the correct image and the target image into blocks and perform alignment for each of the blocks by using the acquired image information, and set a region including a movement amount of the alignment as a block and detect a defect by collating the correct image and the target image for each block.