The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 29, 2023

Filed:

Jul. 01, 2020
Applicant:

Huizhou China Star Optoelectronics Technology Co., Ltd., Guangdong, CN;

Inventor:

Yanxue Wang, Guangdong, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06V 10/25 (2022.01); G06V 10/56 (2022.01); G06V 10/60 (2022.01);
U.S. Cl.
CPC ...
G06T 7/0002 (2013.01); G06V 10/25 (2022.01); G06V 10/56 (2022.01); G06V 10/60 (2022.01); G06T 2207/10024 (2013.01); G06V 2201/07 (2022.01);
Abstract

The present application discloses a mura detecting method, device and readable storage medium. The method includes obtaining an area of a target test image obtained from an original image signal where mura exists to serve as a target test area; processing the target test area to obtain a grayscale distribution; obtaining a brightness gradient distribution based on the grayscale distribution; calculating a SEMU value based on the brightness gradient distribution; and obtaining a location corresponding to the mura area based on the SEMU value. It realizes objective measurement and evaluation of halo phenomenon.


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