The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 29, 2023

Filed:

Oct. 19, 2021
Applicant:

Dimensional Insight Incorporated, Burlington, MA (US);

Inventors:

Frederick A. Powers, Sudbury, MA (US);

James Clark, Andover, MA (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06Q 10/0639 (2023.01); G06F 16/2457 (2019.01);
U.S. Cl.
CPC ...
G06Q 10/06393 (2013.01); G06F 16/24578 (2019.01);
Abstract

Assisted analytics, facilitates responding to a user selection of a measure that is calculated from a data set that is characterized by a plurality of dimensions of data, populating, with a processor a set of dimensions of the data with dimensions that contribute at least one data value to the user selected measure by calculating, for each dimension of the data in the set of dimensions of data a measure outlier threshold for a set of timeframe-specific values of the measure. This outlier threshold is applied, for each dimension of the data in the set of dimensions of data to calculate a dimension-specific outlier factor by aggregating timeframe-specific outlier weights for each timeframe in which a timeframe-specific value in the set of timeframe-specific values exceeds the measure outlier threshold. The results of this aggregation can be displayed in a ranked list of dimensions based on the dimension-specific outlier factor.


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